• DocumentCode
    820050
  • Title

    Optical monitoring of partial vapor pressures in CdTe and CdZnTe systems: a new tool for material technology development

  • Author

    Zappettini, A. ; Bissoli, F.

  • Author_Institution
    IMEM-CNR Inst., Parma
  • Volume
    52
  • Issue
    6
  • fYear
    2005
  • Firstpage
    3079
  • Lastpage
    3084
  • Abstract
    A technique for the determination of the partial pressures of Cd and Te2 vapors in equilibrium with cadmium zinc telluride (CdZnTe) crystals has been developed. The technique has shown a large range of applicability. First of all, the technique can be used for the in-situ monitoring of the partial vapor pressures in the case of technological relevant processes, such as material purification and crystal growth. Moreover, the technique is applied to the characterization of the composition of CdZnTe crystals with a sensitivity of at least two orders of magnitude more than previously reported techniques
  • Keywords
    II-VI semiconductors; X-ray detection; cadmium compounds; crystal growth from melt; semiconductor counters; stoichiometry; zinc compounds; Cd vapor; CdTe; CdTe system; CdZnTe; CdZnTe system; Te2 vapors; cadmium zinc telluride crystals; crystal composition; crystal growth; in-situ monitoring; material purification; material technology development; optical monitoring; partial vapor pressure monitoring; stoichiometry; Absorption; Crystalline materials; Crystals; Materials science and technology; Monitoring; Optical filters; Optical sensors; Tellurium; Temperature; Zinc compounds; cadmium zinc telluride (CdZnTe); composition determination; stoichiometry; vapor pressure monitoring;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2005.862914
  • Filename
    1589324