DocumentCode
820050
Title
Optical monitoring of partial vapor pressures in CdTe and CdZnTe systems: a new tool for material technology development
Author
Zappettini, A. ; Bissoli, F.
Author_Institution
IMEM-CNR Inst., Parma
Volume
52
Issue
6
fYear
2005
Firstpage
3079
Lastpage
3084
Abstract
A technique for the determination of the partial pressures of Cd and Te2 vapors in equilibrium with cadmium zinc telluride (CdZnTe) crystals has been developed. The technique has shown a large range of applicability. First of all, the technique can be used for the in-situ monitoring of the partial vapor pressures in the case of technological relevant processes, such as material purification and crystal growth. Moreover, the technique is applied to the characterization of the composition of CdZnTe crystals with a sensitivity of at least two orders of magnitude more than previously reported techniques
Keywords
II-VI semiconductors; X-ray detection; cadmium compounds; crystal growth from melt; semiconductor counters; stoichiometry; zinc compounds; Cd vapor; CdTe; CdTe system; CdZnTe; CdZnTe system; Te2 vapors; cadmium zinc telluride crystals; crystal composition; crystal growth; in-situ monitoring; material purification; material technology development; optical monitoring; partial vapor pressure monitoring; stoichiometry; Absorption; Crystalline materials; Crystals; Materials science and technology; Monitoring; Optical filters; Optical sensors; Tellurium; Temperature; Zinc compounds; cadmium zinc telluride (CdZnTe); composition determination; stoichiometry; vapor pressure monitoring;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2005.862914
Filename
1589324
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