Title :
A Pre-Irradiation Indicator for Total-Dose Ionizing Radiation-Sensitivity
Author_Institution :
Naval Research Laboratory Washington, D. C. 20375
Keywords :
Circuit testing; Crystallography; Electric variables; Etching; Ionizing radiation; Laboratories; MOS devices; Oxidation; Radiation monitoring; Silicon;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1975.4328074
