DocumentCode :
820338
Title :
Tabletop Resonant Infrared Matrix-Assisted Pulsed Laser Evaporation of Light-Emitting Organic Thin Films
Author :
Pate, Ryan ; Lantz, Kevin R. ; Stiff-Roberts, Adrienne D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC
Volume :
14
Issue :
4
fYear :
2008
Firstpage :
1022
Lastpage :
1030
Abstract :
Structural optimization of light-emitting polymer, or organic semiconductor, thin films deposited by tabletop 2.9 mum resonant infrared matrix-assisted pulsed evaporation (RIR-MAPLE) is investigated. Surface morphology of poly[2-methoxy-5-(2´-ethylhexyloxy)-1,4-(1-cyanovinylene) phenylene] (MEH-CN-PPV) and poly[2-methoxy-5-(2´-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) films are analyzed using optical and atomic force microscopy. These films are deposited using different target-to-substrate distances, ambient base pressures, laser fluences, and substrate temperatures, and with different target compositions comprising tetrahydrofuran (THF), chlorobenzene, toluene, o -xylene, chloroform, phenol:THF, and phenol:water. The corresponding optical behavior and chemical structure of the deposited films is investigated with photoluminescence spectroscopy and Fourier transform infrared spectroscopy. The use of a novel RIR-MAPLE emulsion target recipe enables the successful incorporation of MEH-CN-PPV and MEH-PPV polymers into ice matrices, and an MEH-PPV thin film with near-featureless surface morphology and an unprecedented rms surface roughness of 0.292 nm is demonstrated.
Keywords :
Fourier transform spectra; infrared spectra; organic semiconductors; photoluminescence; polymer films; pulsed laser deposition; semiconductor thin films; surface morphology; surface roughness; vapour deposition; Fourier transform infrared spectroscopy; RIR-MAPLE; atomic force microscopy; chemical structure; chlorobenzene; chloroform; light-emitting organic thin films; light-emitting polymer; o-xylene; optical microscopy; organic semiconductor; phenol:THF; phenol:water; photoluminescence spectroscopy; poly[2-methoxy-5-(2"-ethylhexyloxy)-1,4-(1-cyanovinylene) phenylene]; poly[2-methoxy-5-(2"-ethylhexyloxy)-1,4-phenylene vinylene]; resonant infrared matrix-assisted pulsed laser evaporation; surface morphology; surface roughness; tetrahydrofuran; toluene; Active matrix organic light emitting diodes; Atom optics; Optical films; Optical pulses; Polymer films; Pulsed laser deposition; Resonance; Semiconductor lasers; Surface morphology; Transistors; Infrared matrix-assisted pulsed evaporation (IR-MAPLE); MAPLE; poly[2-methoxy-5-(2″-ethylh-exyloxy)-1,4-(1-cyanovinylene) phenylene] (MEH-CN-PPV); poly[2-methoxy-5-(2″-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV); resonant infrared (RIR)-MAPLE;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2008.915625
Filename :
4582389
Link To Document :
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