A New Uniform Calibration Method for Double-Sided Silicon Strip Detectors

We proposed and implemented a new uniform calibration approach for double-sided silicon strip detector, named the self-calibration method (SCM). This method uses the strips on one side of the detector as references, to calibrate the strips on the other side, and vice versa. This calibration method has the inherent advantages that it can be run during the experiment corresponding exactly to the required particle type and energy range, and provides good statistics based on flexible selection of the event samples. Two strategies based on the same working principle but with deferent complexities, named simple SCM and overall SCM, were introduced and examined experimentally. The simple SCM requires less computation but a large number of events, while the overall SCM exhibits excellent performance even with a relatively small number of events.