DocumentCode :
820377
Title :
Fault confinement mechanisms on CAN: analysis and improvements
Author :
Gaujal, Bruno ; Navet, Nicolas
Author_Institution :
ID Lab., INRIA, Montbonnot, France
Volume :
54
Issue :
3
fYear :
2005
fDate :
5/1/2005 12:00:00 AM
Firstpage :
1103
Lastpage :
1113
Abstract :
The Controller Area Network (CAN) protocol possesses fault confinement mechanisms aimed at differentiating between short disturbances caused by electromagnetic interference (EMI) and permanent failures due to hardware dysfunctioning. In this paper, we derive a Markovian analysis of these mechanisms which enables one to assess the risk of reaching one of the two degraded modes-busoff and error-passive-defined by CAN. We identify several problems with the existing mechanisms, the major one being that the busoff state is reached too easily. In particular, it happens with bursts of EMI causing several consecutive transmission errors. We propose new mechanisms that address these drawbacks. The basic idea is to weigh the progression toward the degraded mode by the quantity of information given by the last transmission. In our experiments, these mechanisms proved to be effective: the hitting time of busoff for nonfaulty nodes increases hugely while faulty systems reach busoff in the same amount of time. In the last part of this paper, implementation issues are discussed and different techniques for tuning the parameters of the algorithm are provided, either off-line or at run-time.
Keywords :
Markov processes; controller area networks; electromagnetic interference; fault tolerance; protocols; CAN; Markovian analysis; controller area network; electromagnetic interference; fault confinement mechanism; Bit error rate; Degradation; Electromagnetic analysis; Electromagnetic interference; Error correction; Failure analysis; Hardware; Physical layer; Protocols; Switches; Controller Area Network (CAN); electromagnetic interferences; fault confinement; fault tolerance; real-time systems;
fLanguage :
English
Journal_Title :
Vehicular Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9545
Type :
jour
DOI :
10.1109/TVT.2005.844652
Filename :
1433254
Link To Document :
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