An accurate measuring system for VTR magnetic track

Author

Liu, Yan ; Chen, Hongyou ; Yang, Jiongfeng ; Yi, Jingzeng

Author_Institution

Center of Electron. Mater. Anal., Univ. of Electron. Sci. & Technol. of China, Sichuan, China

Volume

28

Issue

5

fYear

1992

fDate

9/1/1992 12:00:00 AM

Firstpage

2473

Lastpage

2475

Abstract

A novel design is presented, and the corresponding measuring system, which can be used to calibrate the servomechanism of a VTR (video tape recorder), to test the assembly errors of the video head drum assemblies, and to determine the exchangeability of the VTR, has been built. This design is based on the principle of the Bitter pattern method to show the magnetic track and the digital image processing technology, as well as the precise electromagnetic micromotion device. The accuracy of the previous measuring system depends on the location accuracy of the specimen stage of the measuring microscope, and it is about 0.5-1 μm. In the present system, the measuring precision depends on the system amplification and the resolution of the digital image processing interface. Therefore, it is possible to improve the measuring accuracy of this system to deep submicrometer. As a result, the distance measurement precision of the present measuring system reaches 0.2 μm

Keywords

computerised instrumentation; distance measurement; image processing; magnetic domains; magnetic heads; magnetic tapes; measurement systems; servomechanisms; video tape recorders; Bitter pattern method; VTR magnetic track; accurate measuring system; assembly errors; deep submicrometer; digital image processing technology; distance measurement precision; electromagnetic micromotion device; exchangeability; magnetic track; servomechanism; video head drum assemblies; Assembly systems; Digital images; Electromagnetic devices; Electromagnetic measurements; Magnetic devices; Magnetic heads; Microscopy; Servomechanisms; System testing; Video recording;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.179530

Filename

179530