DocumentCode
820653
Title
The effect of low mobility sputter conditions on thin-film disk tribology
Author
Schulz, K.J. ; Viswanathan, K.V. ; Wall, A.C. ; Bowen, A.J.
Author_Institution
IBM, Rochester, MN, USA
Volume
28
Issue
5
fYear
1992
fDate
9/1/1992 12:00:00 AM
Firstpage
2527
Lastpage
2529
Abstract
The deposition conditions used to sputter the magnetic layer of a thin-film disk were found to have a significant influence on tribological performance. Low-mobility sputter conditions (low deposition rate, high sputter pressure, and low substrate temperature) led to columnar Co (Cr, Pt) magnetic grains with domed tops which were isolated by intergranular voids. These films have been used to reduce media noise. The microtopography of these magnetic films resulted in shadowing during the subsequent deposition of the overcoat film. The porous carbon overcoats showed degraded abrasion and corrosion resistance. However, larger amounts of perfluoropolyether lubricant could be applied to the low-mobility disks without a viscous stiction response. Despite the lower carbon abrasion resistance, low-mobility disks showed improved contact start/stop wear and stiction performance. Shifts were observed in lubricant evaporation rates. Fourier-transform infrared (FTIR) lubricant measurements, and the rates of hydrocarbon adsorption from the environment
Keywords
abrasion; chromium; chromium alloys; cobalt alloys; corrosion; lubrication; magnetic disc storage; magnetic film stores; platinum alloys; sputter deposition; wear; Cr-CoPtCr-C; FTIR; abrasion resistance; columnar magnetic grains; contact start/stop wear; corrosion resistance; high sputter pressure; hydrocarbon adsorption; intergranular voids; low deposition rate; low mobility sputter conditions; low substrate temperature; lubricant evaporation rates; magnetic layer; microtopography; overcoat film; perfluoropolyether lubricant; porous C overcoats; shadowing; stiction performance; thin-film disk tribology; Chromium; Degradation; Lubricants; Magnetic films; Magnetic noise; Noise reduction; Shadow mapping; Sputtering; Substrates; Temperature;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.179545
Filename
179545
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