DocumentCode :
820753
Title :
100-GHz cooled amplifier residual PM and AM noise measurements, noise figure, and jitter calculations
Author :
Howe, David A. ; Ostrick, Jeffery R.
Author_Institution :
Time & Frequency Metrol. Group, Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Volume :
51
Issue :
11
fYear :
2003
Firstpage :
2235
Lastpage :
2242
Abstract :
We report the first definitive PM and AM noise measurements at 100 GHz of indium phosphide (InP) amplifiers operating at 5 K, 77 K, and room temperature. Amplifier gain ranged from +7 to +30 dB, depending on input RF power levels and operating bias current and gate voltages. The measurement system, calibration procedure, and amplifier configuration are described along with strategies for reducing the measurement system noise floor in order to accurately make these measurements. We compute amplifier noise figure with an ideal oscillator signal applied and, based on the PM noise measurements, obtain NF=0.8 dB, or a noise temperature of 59 K. Measurement uncertainty is estimated at ±0.3 dB. Results show that the use of the amplifier with an ideal 100-GHz reference oscillator would set a lower limit on rms clock jitter of 44.2 fs in a 20-ps sampling interval if the power into the amplifier were -31.6 dBm. For comparison, clock jitter is 16 fs with a commercial room-temperature amplifier operating in saturation with an input power of -6.4 dBm.
Keywords :
III-V semiconductors; MMIC amplifiers; amplitude modulation; cryogenic electronics; electric noise measurement; field effect MIMIC; indium compounds; integrated circuit noise; measurement uncertainty; millimetre wave amplifiers; millimetre wave measurement; phase modulation; phase noise; timing jitter; 100 GHz; 100-GHz cooled amplifier; 5 to 295 K; 7 to 30 dB; InP; InP amplifiers; MMICs; amplifier configuration; amplifier gain; calibration procedure; gate voltages; ideal 100-GHz reference oscillator; ideal oscillator signal; input RF power levels; jitter; measurement system; measurement uncertainty; noise figure; operating bias current; phase modulation noise; residual AM noise measurements; residual PM noise measurements; rms clock jitter; saturation operation; spectral analysis; Clocks; Indium phosphide; Jitter; Noise figure; Noise measurement; Oscillators; Power amplifiers; Radio frequency; Radiofrequency amplifiers; Temperature;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2003.818934
Filename :
1242986
Link To Document :
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