Title :
Hardness Assurance Considerations for the Neutron Environment
Author_Institution :
Rockwell International Corporation
Keywords :
Circuit synthesis; Degradation; Equations; Helium; Manufacturing; Neutrons; Probability; Semiconductor device manufacture; Semiconductor devices; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1975.4328124
