DocumentCode :
820779
Title :
V-band HJFET MMIC DROs with low phase noise, high power, and excellent temperature stability
Author :
Hosoya, Ken´ichi ; Ohata, Keiichi ; Funabashi, Masahiro ; Inoue, Takashi ; Kuzuhara, Masaaki
Author_Institution :
Photonic & Wireless Devices Res. Labs., NEC Corp., Ibaraki, Japan
Volume :
51
Issue :
11
fYear :
2003
Firstpage :
2250
Lastpage :
2258
Abstract :
This paper describes the development, along with detailed phase-noise analysis, of V-band monolithic-microwave integrated-circuit (MMIC) dielectric-resonator oscillators (DROs) achieving state-of-the-art performances. A TE01δ-mode Ba(Mg,Ta)O3 cylindrical dielectric resonator (DR) is directly placed on a MMIC GaAs substrate to avoid the loss and uncertainty of bonding wires. A 0.15-μm AlGaAs-InGaAs heterojunction field-effect transistor with optimized structure is developed as an active device. A design procedure proposed by the authors is employed, which allows us to analyze and optimize circuits in consideration for the output power, phase noise, and temperature stability. A developed DRO co-integrated with a buffer amplifier exhibits a low phase noise of -90 dBc/Hz at 100-kHz offset, a high output power of 10.0 dBm, and an excellent frequency stability of 1.6 ppm/°C at an oscillation frequency of 59.6 GHz, all of which are state-of-the-art performances reported for MMIC DROs above V-band. An experimental and theoretical analysis for the phase-noise-reduction effect of a DR is also addressed.
Keywords :
III-V semiconductors; JFET integrated circuits; MMIC oscillators; aluminium compounds; barium compounds; circuit optimisation; circuit stability; dielectric resonator oscillators; field effect MIMIC; frequency stability; gallium arsenide; indium compounds; integrated circuit design; integrated circuit noise; millimetre wave oscillators; phase noise; thermal stability; 0.15 micron; 59.6 GHz; AlGaAs-InGaAs; AlGaAs-InGaAs heterojunction field-effect transistor; BaMgO3TaO3; MMIC GaAs substrate; TE01δ-mode Ba(Mg,Ta)O3 cylindrical dielectric resonator; V-band HJFET MMIC DROs; buffer amplifier co-integration; circuit optimization; design procedure; frequency stability; high power; low phase noise; optimized structure; oscillation frequency; output power; phase-noise analysis; phase-noise-reduction effect; temperature stability; Circuit stability; Dielectric losses; Dielectric substrates; Field effect MMICs; Frequency; Performance analysis; Phase noise; Power amplifiers; Power generation; Temperature;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2003.818937
Filename :
1242988
Link To Document :
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