DocumentCode :
820792
Title :
A stochastic characterization of chronic ventricular ectopic activity
Author :
Albrecht, Paul ; Cohen, Richard J. ; Mark, Roger G.
Author_Institution :
Harvard Univ., Cambridge, MA, USA
Volume :
35
Issue :
7
fYear :
1988
fDate :
7/1/1988 12:00:00 AM
Firstpage :
539
Lastpage :
550
Abstract :
A novel approach for studying the generation of ventricular ectopic beats (VEBs) is reported. The approach is based on the hypotheses that VEBs are often generated by a mechanism (VEB mechanism) which is stable over time, but whose activity is modulated by a variety of physiologic influences. The hypothesis suggests that VEB generation should be predictable and should be related to other physiologic parameters. The relationship should be reproducible under similar conditions,. To pursue this hypothesis, an analytic approach was developed which represents VEB generation with a conditional probability distribution. The distribution gives the probability that the next beat is a VEB, given information about the preceding beats. Using this approach on a database of half-hour ECG (electrocardiogram) tapes, it is shown that VEB generation is usually related to the preceding beat type and timing, and that this relationship is often reproducible over time. It is concluded that, in a given patient, VEB generation often shows consistent patterns which might serve as a potentially valuable characterization of the patient´s VEB mechanism.
Keywords :
electrocardiography; stochastic processes; analytic approach; chronic ventricular ectopic activity; conditional probability distribution; half-hour ECG; physiologic influences; stochastic characterization; Cardiac disease; Databases; Electrocardiography; Fibrillation; Heart rate; Heart rate variability; Isolation technology; Probability distribution; Stochastic processes; Strips; Arrhythmias, Cardiac; Chronic Disease; Electrocardiography; Heart Ventricles; Humans; Stochastic Processes;
fLanguage :
English
Journal_Title :
Biomedical Engineering, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9294
Type :
jour
DOI :
10.1109/10.4583
Filename :
4583
Link To Document :
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