Title :
Transient current off-chip sensor circuit for digital IC production testing
Author :
Alorda, B. ; Bloechel, B. ; Keshavarzi, A. ; Segura, J.
Author_Institution :
Dept. de Fisica, Univ. de les Illes Baleares, Palma de Mallorca, Spain
fDate :
8/29/2002 12:00:00 AM
Abstract :
An off-chip monitor is presented that measures the transient supply current of CMOS ICs and provides the charge delivered to the circuit. The monitor is designed to be placed on the automatic test equipment board fixture and automate transient current supply testing. Experimental results demonstrate up to 1 GHz bandwidth operation
Keywords :
CMOS digital integrated circuits; automatic testing; condition monitoring; electric current measurement; electric sensing devices; integrated circuit testing; production testing; transients; 1 GHz; ATE board fixture; CMOS ICs; automatic test equipment fixture; digital IC production testing; off-chip monitor; off-chip sensor circuit; transient current sensor circuit; transient current supply testing; transient supply current;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20020694
