Wiggles in transition response of MIG ferrite heads

Author

Shi, X. ; Kryder, M.H. ; Shrinkle, L.J.

Author_Institution

Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

28

Issue

5

fYear

1992

fDate

9/1/1992 12:00:00 AM

Firstpage

2638

Lastpage

2640

Abstract

The cause of wiggles in the read-back signal of a series of MIG heads has been studied. A digitizing signal analyzer was used to analyze the read-back signals of the heads. These heads were then studied on a scanning magnetooptic photometer system by measuring the magnetic activity on the air-bearing surfaces. Defects having strong magnetic effects were observed in both the ferrite and the Sendust. It is shown that these defects are responsible for the wiggles in the read-back signal of these heads. It is believed that some defects in the Sendust are caused by variations of magnetic properties from grain to grain, and some are caused by diffusion of interface layer material taking place during the glass bonding process. The defects in ferrites are believed to be caused by inclusions

Keywords

Kerr magneto-optical effect; ferrite devices; magnetic heads; magnetisation; manganese compounds; photometry; zinc compounds; MIG ferrite heads; Mn_1-xZn_xFe₂O₄; MnZn ferrite; Sendust; air-bearing surfaces; digitizing signal analyzer; glass bonding process; interface layer material diffusion; longitudinal Kerr magnetooptic effect; magnetic activity; magnetic properties; magnetisation; read-back signal; scanning magnetooptic photometer system; transition response wiggles; Bonding processes; Ferrites; Glass; Magnetic analysis; Magnetic heads; Magnetic materials; Magnetic properties; Magnetooptic effects; Photometry; Signal analysis;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.179581

Filename

179581