DocumentCode :
821065
Title :
A study of MIG head readout waveform asymmetry, using magnetic force and Kerr microscopy
Author :
Takayama, S. ; Sueoka, K. ; Setoh, H. ; Schäfer, R. ; Argyle, B.E. ; Trouilloud, P.L.
Author_Institution :
IBM Japan Ltd., Tokyo, Japan
Volume :
28
Issue :
5
fYear :
1992
fDate :
9/1/1992 12:00:00 AM
Firstpage :
2647
Lastpage :
2649
Abstract :
The cause of the readback waveform distortion in polycrystalline ferrite metal-in-gap (MIG) heads was investigated by using a magnetic force microscope (MFM) and a polarized optical microscope capable of microellipsometry for grain contrast and Kerr microscopy for domain contrast. It was revealed that, for high-asymmetry MIG heads, relatively large leakage of magnetic flux associated with complex multiple domains exists at remanence in the leading-side ferrite surface adjacent to the gap. The strengths of the magnetic flux and the magnetic domain states change irreproducibly when coil current is repeatedly applied. Such a remanent flux associated with the complex remanent state of magnetization distribution in the ferrite can cause an inhomogeneous flux coupling between the head and the recorded track, resulting in readback waveform asymmetry
Keywords :
Kerr magneto-optical effect; ferrite devices; magnetic domains; magnetic flux; magnetic force microscopy; magnetic heads; remanence; FeAlSi-Mn1-xZnxFe2O4; Kerr microscopy; MFM; MIG head readout waveform asymmetry; Mn1-xZnxFe2O4; coil current; complex multiple domains; domain contrast; grain contrast; inhomogeneous flux coupling; leading-side ferrite surface; magnetic domain states; magnetic flux leakage; magnetic force microscope; microellipsometry; polarized optical microscope; polycrystalline ferrite metal in gap heads; remanence; remanent flux; Ferrites; Magnetic domains; Magnetic flux; Magnetic force microscopy; Magnetic forces; Magnetic heads; Optical distortion; Optical microscopy; Optical polarization; Remanence;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.179584
Filename :
179584
Link To Document :
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