DocumentCode :
821171
Title :
Measured propagation characteristics of coplanar waveguide on semi-insulating 4H-SiC through 800 K
Author :
Ponchak, George E. ; Alterovitz, Samuel A. ; Downey, Alan N. ; Freeman, Jon C. ; Schwartz, Zachary D.
Author_Institution :
NASA Glenn Res. Center, Cleveland, OH, USA
Volume :
13
Issue :
11
fYear :
2003
Firstpage :
463
Lastpage :
465
Abstract :
Wireless sensors for high temperature industrial applications and jet engines require RF transmission lines and RF integrated circuits (RFICs) on wide bandgap semiconductors such as SiC. In this paper, the complex propagation constant of coplanar waveguide fabricated on semi-insulating 4H-SiC has been measured through 813 K. It is shown that the attenuation increases 3.4 dB/cm at 50 GHz as the SiC temperature is increased from 300 K to 813 K. Above 500 K, the major contribution to loss is the decrease in SiC resistivity. The effective permittivity of the same line increases by approximately 5% at microwave frequencies and 20% at 1 GHz.
Keywords :
coplanar waveguides; electrical resistivity; high-temperature electronics; microwave measurement; permittivity; radiofrequency integrated circuits; silicon compounds; wide band gap semiconductors; 1 to 50 GHz; 3 to 8.75 muohmcm; 300 to 813 K; RF transmission lines; RFICs; SiC; SiC resistivity; SiC temperature; attenuation; complex propagation constant; coplanar waveguide; effective permittivity; high temperature industrial applications; jet engines; propagation characteristics; semi-insulating 4H-SiC; wide bandgap semiconductors; wireless sensors; Coplanar waveguides; Integrated circuit measurements; Radio frequency; Radiofrequency integrated circuits; Semiconductor waveguides; Sensor phenomena and characterization; Silicon carbide; Temperature sensors; Transmission line measurements; Wireless sensor networks;
fLanguage :
English
Journal_Title :
Microwave and Wireless Components Letters, IEEE
Publisher :
ieee
ISSN :
1531-1309
Type :
jour
DOI :
10.1109/LMWC.2003.819373
Filename :
1243532
Link To Document :
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