Title :
Uniform remanent state noise and its relation to microstructure [magnetic tapes]
Author :
Bissell, P.R. ; Araghi, M.S. ; Clarke, M.D. ; Chantrell, R.W.
Author_Institution :
Lancashire Polytech., Preston, UK
fDate :
9/1/1992 12:00:00 AM
Abstract :
DC noise measurements for particulate and metal evaporated thin-film tapes in which noise levels are recorded as a function of the remanent magnetization state are described. For particulate tapes, noise is seen to rise with magnetization, although these are deviations from a straight line relationship. For metal evaporated tapes, the noise is related to a recent theory and indicates a decrease in noise level with magnetization squared, except for small field applications after AC demagnetization
Keywords :
demagnetisation; magnetic properties of fine particles; magnetic tapes; magnetic thin films; noise; remanence; AC demagnetization; DC noise; Fe2O3:Co; metal evaporated thin-film tapes; noise levels; particulate tapes; remanent magnetization state; Magnetic field measurement; Magnetic heads; Magnetic noise; Microstructure; Noise generators; Noise level; Noise measurement; Remanence; Saturation magnetization; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
