Title :
Effects of Ionizing Radiation on a 256-Stage Linear CCD Imager
Author :
Killiany, J.M. ; Saks, N.S. ; Baker, W.D.
Author_Institution :
Naval Research Laboratory, Washington, D. C. 20375
Abstract :
The total dose effects of gamma radiation on an unhardened 256-stage linear CCD imager have been investigated. Key device parameters were monitored and the primary failure mechanisms identified. Additional structural design rules for radiation hard CCD´s were formulated. The performance of a threshold insensitive input technique was evaluated.
Keywords :
Charge coupled devices; Condition monitoring; Electrodes; Failure analysis; Gamma rays; Insulation; Ionizing radiation; Laboratories; Testing; Threshold voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1975.4328181
