DocumentCode :
821331
Title :
Reliable Systems on Unreliable Fabrics
Author :
Austin, Todd ; Bertacco, Valeria ; Mahlke, Scott ; Cao, Yu
Author_Institution :
CSE-ACAL Lab., Michigan Univ., Ann Arbor, MI
Volume :
25
Issue :
4
fYear :
2008
Firstpage :
322
Lastpage :
332
Abstract :
The continued scaling of silicon fabrication technology has led to significant reliability concerns, which are quickly becoming a dominant design challenge. Design integrity is threatened by complexity challenges in the form of immense designs defying complete verification, and physical challenges such as silicon aging and soft errors, which impair correct system operation. The Gigascale Systems Research Center Resilient-System Design Team is addressing these key challenges through synergistic research thrusts, ranging from near-term reliability stress reduction techniques to methods for improving the quality of today´s silicon, to longer-term technologies that can detect, recover, and repair faulty systems. These efforts are supported and complemented by an active fault-modeling research effort and a strong focus on functional-verification methodologies. The team´s goal is to provide highly effective, low-cost solutions to ensure both correctness and reliability in future designs and technology nodes, thereby extending the lifetime of silicon fabrication technologies beyond what can be currently foreseen as profitable.
Keywords :
design engineering; fabrics; reliability; Gigascale Systems Research Center Resilient-System Design Team; active fault-modeling research effort; design integrity; fabric unreliability; functional-verification methodologies; silicon fabrication technology; stress reduction techniques; Circuit faults; Costs; Data communication; Fabrication; Fabrics; Integrated circuit noise; Lithography; Semiconductor device noise; Silicon; Threshold voltage; GSRC; Resilient-System Design Team; fault-modeling research; reliability stress reduction; reliable systems; silicon fabrication technologies; unreliable fabrics;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2008.107
Filename :
4584456
Link To Document :
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