Title :
Connecting System Identification and Robust Control for Next-Generation Motion Control of a Wafer Stage
Author :
Oomen, Tom ; van Herpen, Robbert ; Quist, S. ; van de Wal, Marc ; Bosgra, Okko ; Steinbuch, Maarten
Author_Institution :
Eindhoven Univ. of Technol., Eindhoven, Netherlands
Abstract :
Next-generation precision motion systems are lightweight to meet stringent requirements regarding throughput and accuracy. Such lightweight systems typically exhibit lightly damped flexible dynamics in the controller cross-over region. State-of-the-art modeling and motion control design procedures do not deliver the required model complexity and fidelity to control the flexible dynamical behavior. The aim of this paper is to develop a combined system identification and robust control design procedure for high performance motion control and apply it to a wafer stage. Hereto, new connections between system identification and robust control are employed. The experimental results confirm that the proposed procedure significantly extends existing results and enables next-generation motion control design.
Keywords :
control system synthesis; identification; lithography; motion control; multivariable control systems; robust control; semiconductor technology; connecting system identification; controller cross-over region; high performance motion control; lightly damped flexible dynamics; motion control design procedures; next-generation precision motion systems; robust control design procedure; wafer stage; Bandwidth; Control design; Motion control; Next generation networking; Robust control; Robustness; Semiconductor device modeling; Control applications; model uncertainty; model validation; motion control; motion systems; multivariable control; robust control; system identification for control;
Journal_Title :
Control Systems Technology, IEEE Transactions on
DOI :
10.1109/TCST.2013.2245668