DocumentCode :
821589
Title :
A hardware logic simulation system
Author :
Agrawal, Prathima ; Dally, William J.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
Volume :
9
Issue :
1
fYear :
1990
fDate :
1/1/1990 12:00:00 AM
Firstpage :
19
Lastpage :
29
Abstract :
Multiple-delay logic simulation algorithms developed for the microprogrammable accelerator for rapid simulations (MARS) hardware simulator are discussed. In particular, timing-analysis algorithms for event cancellations, spike and race analyses, and oscillation detection are described. It is shown how a reconfigurable set of processors, called processing elements (PEs), can be arranged in a pipelined configuration to implement these algorithms. The algorithms operate within the partitioned-memory, message-passing architecture of MARS. Three logic simulators-two multiple delay and one unit delay-have been implemented using slightly different configuration of the available PEs. In these simulators, VLSI chips are modeled at the gate level with accurate rise/fall delays assigned to each logic primitive. On-chip memory blocks are modeled functionally and are integrated into the simulation framework. The MARS hardware simulator has been tested on many VLSI chip designs and has demonstrated a speed improvement of about 50 times that of an Amdahl 5870 system running a production-quality software simulator while retaining the accuracy of simulations
Keywords :
VLSI; digital simulation; hazards and race conditions; logic CAD; pipeline processing; VLSI chips; event cancellations; gate level; hardware logic simulation system; logic primitive; message-passing architecture; microprogrammable accelerator; multiple-delay logic simulation; oscillation detection; pipelined configuration; processing elements; production-quality software simulator; race analyses; rapid simulations; simulation framework; speed improvement; spike analysis; timing-analysis algorithms; Algorithm design and analysis; Delay; Event detection; Hardware; Mars; Partitioning algorithms; Reconfigurable logic; Software testing; System testing; Very large scale integration;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.45853
Filename :
45853
Link To Document :
بازگشت