Title :
Thermally Stimulated Current Measurement of Traps in Detector-Grade CdTe
Author :
Barnes, C.E. ; Zanio, K.
Author_Institution :
Sandia Laboratories Albuquerque, New Mexico 87115
Abstract :
Thermally stimulated current (TSC) has been measured in ¿ detector-grade, high resistivity CdTe:In and CdTe:In,Cl. Electron mobility-trapping time products, ¿¿+, measured at room temperature correlate strongly with the shape and magnitude of a prominent TSC band observed at 40 K. This correlation is used as the basis for a simple method of selecting samples appropriate for detector applications.
Keywords :
Conductivity; Current measurement; Detectors; Electron mobility; Electron traps; Laboratories; Radiative recombination; Shape measurement; Spontaneous emission; Temperature;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1976.4328233
