Inhomogeneities and coercivity of soft Permalloy thin films

Author

Yuan, Samuel W. ; Bertram, H. Neal

Author_Institution

Center for Magnetic Recording Res., California Univ., San Diego, La Jolla, CA, USA

Volume

28

Issue

5

fYear

1992

fDate

9/1/1992 12:00:00 AM

Firstpage

2916

Lastpage

2918

Abstract

Coercivity mechanisms in thin 1000-Å Permalloy films due to inhomogeneous distributions of in-plane uniaxial anisotropy are investigated numerically, utilizing a two-dimensional domain wall model. The distribution of anisotropy could be attributed to the polycrystalline grain structure of thin films, as well as magnetostrictive stress. Typical anisotropy orientation dispersion induced by polycrystalline grains does not appear to account for the wall coercive force observed in soft Permalloy films. Other mechanisms, such as stress-induced anisotropy, may be dominant

Keywords

Permalloy; coercive force; ferromagnetic properties of substances; magnetic anisotropy; magnetic domain walls; magnetic thin films; anisotropy orientation dispersion; coercivity; in-plane uniaxial anisotropy; inhomogeneous distributions; magnetic film; magnetostrictive stress; polycrystalline grain structure; soft Permalloy thin films; stress-induced anisotropy; two-dimensional domain wall model; wall coercive force; Anisotropic magnetoresistance; Coercive force; Magnetic anisotropy; Magnetic domain walls; Magnetic domains; Magnetic materials; Magnetostatics; Magnetostriction; Perpendicular magnetic anisotropy; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.179671

Filename

179671