DocumentCode
822148
Title
Computer-aided modeling and evaluation of reconfigurable VLSI processor arrays with VHDL
Author
Wang, Kuochen ; Kuo, Sy-Yen
Author_Institution
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
Volume
11
Issue
2
fYear
1992
fDate
2/1/1992 12:00:00 AM
Firstpage
185
Lastpage
197
Abstract
The authors present an integrated computer-aided design environment, the VAR (VHDL-based array reconfiguration) system, for the tasks of design, reconfiguration, simulation, and evaluation in an architecture modeled by VHDL. An easily diagnosable and reconfigurable two-dimensional defect-tolerant processing element (PE) switch lattice array is used as an example to illustrate the methodology of VAR. VAR allows the designers study and evaluate fault diagnosis and reconfiguration algorithms by inserting faults, which are generated based on manufacturing yield data, into the array and then locating the fault PEs as well as simulating the reconfiguration process. Thus, VAR can assist the designers in evaluating the different combinations of fault patterns, fault diagnosis algorithms, and reconfigurable architectures through a complete set of figures of merit which aim at architectural improvements. Extensive simulation and evaluation have been performed to demonstrate and support the effectiveness of VAR
Keywords
VLSI; circuit CAD; fault location; microprocessor chips; 2D array; VHDL; VHDL-based array reconfiguration; computer-aided design; computer-aided modelling; defect-tolerant processing element; fault diagnosis algorithms; fault patterns; integrated CAD environment; reconfigurable VLSI processor arrays; reconfigurable architectures; reconfiguration algorithms; simulation; switch lattice array; Algorithm design and analysis; Computational modeling; Computer architecture; Computer simulation; Design automation; Fault diagnosis; Lattices; Reactive power; Switches; Very large scale integration;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.124397
Filename
124397
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