DocumentCode :
822148
Title :
Computer-aided modeling and evaluation of reconfigurable VLSI processor arrays with VHDL
Author :
Wang, Kuochen ; Kuo, Sy-Yen
Author_Institution :
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
Volume :
11
Issue :
2
fYear :
1992
fDate :
2/1/1992 12:00:00 AM
Firstpage :
185
Lastpage :
197
Abstract :
The authors present an integrated computer-aided design environment, the VAR (VHDL-based array reconfiguration) system, for the tasks of design, reconfiguration, simulation, and evaluation in an architecture modeled by VHDL. An easily diagnosable and reconfigurable two-dimensional defect-tolerant processing element (PE) switch lattice array is used as an example to illustrate the methodology of VAR. VAR allows the designers study and evaluate fault diagnosis and reconfiguration algorithms by inserting faults, which are generated based on manufacturing yield data, into the array and then locating the fault PEs as well as simulating the reconfiguration process. Thus, VAR can assist the designers in evaluating the different combinations of fault patterns, fault diagnosis algorithms, and reconfigurable architectures through a complete set of figures of merit which aim at architectural improvements. Extensive simulation and evaluation have been performed to demonstrate and support the effectiveness of VAR
Keywords :
VLSI; circuit CAD; fault location; microprocessor chips; 2D array; VHDL; VHDL-based array reconfiguration; computer-aided design; computer-aided modelling; defect-tolerant processing element; fault diagnosis algorithms; fault patterns; integrated CAD environment; reconfigurable VLSI processor arrays; reconfigurable architectures; reconfiguration algorithms; simulation; switch lattice array; Algorithm design and analysis; Computational modeling; Computer architecture; Computer simulation; Design automation; Fault diagnosis; Lattices; Reactive power; Switches; Very large scale integration;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.124397
Filename :
124397
Link To Document :
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