DocumentCode :
822196
Title :
Microstructural origin of the magnetically degraded layer in Sendust metal-in-gap recording heads
Author :
Shen, Y. ; Laughlin, D.E. ; Shinohara, T. ; Suwabe, S.
Author_Institution :
Dept. of Mater. Sci. & Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume :
28
Issue :
5
fYear :
1992
fDate :
9/1/1992 12:00:00 AM
Firstpage :
2952
Lastpage :
2954
Abstract :
Microstructural studies using transmission electron microscopy have been performed on Sendust films deposited on both polycrystalline and single-crystal ferrites. A strain-induced contrast in both the ferrite and Sendust and a large number of dislocations in the ferrite region near the interface were observed. However, no intermediate layer of Al2O3 or SiO2 was formed by interdiffusion at the interface. It was found that both the in-plane crystallographic texture and the microstructure of the Sendust films depend on the orientation of the underlying single-crystal ferrite substrates, even though the out-of-plane crystallographic texture appears to be independent of ferrite crystal orientation. A model has been proposed to explain the microstructural origin of the magnetically degraded layer formed at the interface of the Sendust film and ferrite cores in the MIG heads
Keywords :
aluminium alloys; crystal microstructure; ferromagnetic properties of substances; iron alloys; magnetic heads; magnetic interface phenomena; magnetic thin films; silicon alloys; transmission electron microscope examination of materials; FeAlSi; Sendust films; Sendust metal-in-gap recording heads; dislocations; film-core interface; in-plane crystallographic texture; magnetically degraded layer; microstructure; model; polycrystalline ferrite substrates; single-crystal ferrite substrates; strain-induced contrast; transmission electron microscopy; Crystal microstructure; Crystallography; Degradation; Ferrite films; Magnetic cores; Magnetic films; Magnetic heads; Magnetic recording; Soft magnetic materials; Transmission electron microscopy;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.179683
Filename :
179683
Link To Document :
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