Title :
Resistance characterization for weak open defects
Author :
Montañés, Rosa Rodríguez ; De Gyvez, José Pineda ; Volf, Paul
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
Strong open defects can cause a circuit to malfunction, but even weak open defects can cause it to function poorly. Detecting weak opens is thus an important, but challenging, task. Characterizing weak opens can help researchers assess the need for delay fault tests
Keywords :
fault diagnosis; integrated circuit testing; delay fault tests; delay faults; inductive fault analysis; malfunctioning circuits; open defects; Circuit faults; Circuit testing; Clouds; Delay; Monitoring; Routing; Semiconductor device testing; Shape; Uncertainty;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2002.1033788
