Title :
Guest editors´ introduction: stressing the fundamentals
Author :
Aitken, R.C. ; Wheater, D.L.
Author_Institution :
IBM Microelectronics
Abstract :
Presents the guest editorial for this issue of the publication.
Keywords :
Circuit testing; Distributed computing; Electrical engineering; Logic design; Logic devices; Microelectronics; Radio frequency; Software testing; Stress; System-on-a-chip;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2002.1033792
