• DocumentCode
    822820
  • Title

    Extending OPMISR beyond 10× scan test efficiency

  • Author

    Barnhart, Carl ; Brunkhorst, Vanessa ; Distler, Frank ; Farnsworth, Owen ; Ferko, Andrew ; Keller, Brion ; Scott, David ; Koenemann, Bernd ; Onodera, Takeshi

  • Author_Institution
    IBM Microelectron., USA
  • Volume
    19
  • Issue
    5
  • fYear
    2002
  • Firstpage
    65
  • Lastpage
    73
  • Abstract
    Rapidly increasing ASIC gate counts are stressing the test capacity of manufacturing test equipment. New on-product multiple-input signature register (OPMISR) techniques compress test vectors produced by ATPG, substantially reducing data volume and test time
  • Keywords
    automatic test pattern generation; data compression; logic testing; ASIC gate counts; ASICs; BIST; logic built-in self-test; logic testing; on-product multiple-input signature register; test vectors; Application specific integrated circuits; Automatic test pattern generation; Built-in self-test; Logic testing; Manufacturing; Microelectronics; Packaging; Pins; Process design; Test equipment;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2002.1033794
  • Filename
    1033794
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=822820