DocumentCode :
822827
Title :
Analysis of tunneling magnetic force microscopy using a flexible triangular probe
Author :
Burke, E.R. ; Gomez, R.D. ; Adly, A.A. ; Mayergoyz, I.D.
Author_Institution :
Lab. for Phys. Sci., College Park, MD, USA
Volume :
28
Issue :
5
fYear :
1992
fDate :
9/1/1992 12:00:00 AM
Firstpage :
3135
Lastpage :
3137
Abstract :
The authors have performed a theoretical analysis of the interaction between a flexible triangular probe and a typical magnetic pattern on a recorded surface. The use of this analysis allows the measurement of the magnetic fields of the recorded patterns imaged by a tunneling magnetic force microscope. It is also shown how the sensitivity of the microscope varies with the orientation of the probe, and how this relates to experimental data
Keywords :
magnetic field measurement; magnetic force microscopy; magnetic recording; probes; tunnelling; flexible triangular probe; magnetic field measurement; magnetic pattern; recorded surface; sensitivity; tunneling magnetic force microscopy; Force measurement; Image analysis; Magnetic analysis; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetic tunneling; Pattern analysis; Performance analysis; Probes;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.179736
Filename :
179736
Link To Document :
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