DocumentCode
822827
Title
Analysis of tunneling magnetic force microscopy using a flexible triangular probe
Author
Burke, E.R. ; Gomez, R.D. ; Adly, A.A. ; Mayergoyz, I.D.
Author_Institution
Lab. for Phys. Sci., College Park, MD, USA
Volume
28
Issue
5
fYear
1992
fDate
9/1/1992 12:00:00 AM
Firstpage
3135
Lastpage
3137
Abstract
The authors have performed a theoretical analysis of the interaction between a flexible triangular probe and a typical magnetic pattern on a recorded surface. The use of this analysis allows the measurement of the magnetic fields of the recorded patterns imaged by a tunneling magnetic force microscope. It is also shown how the sensitivity of the microscope varies with the orientation of the probe, and how this relates to experimental data
Keywords
magnetic field measurement; magnetic force microscopy; magnetic recording; probes; tunnelling; flexible triangular probe; magnetic field measurement; magnetic pattern; recorded surface; sensitivity; tunneling magnetic force microscopy; Force measurement; Image analysis; Magnetic analysis; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetic tunneling; Pattern analysis; Performance analysis; Probes;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.179736
Filename
179736
Link To Document