• DocumentCode
    822832
  • Title

    Neighborhood selection for IDDQ outlier screening at wafer sort

  • Author

    Daasch, W. Robert ; McNames, James ; Madge, Robert ; Cota, Kevin

  • Author_Institution
    Integrated Circuits Design & Test Lab., Portland State Univ., OR, USA
  • Volume
    19
  • Issue
    5
  • fYear
    2002
  • Firstpage
    74
  • Lastpage
    81
  • Abstract
    To screen defective dies, IDDQ tests require a reliable estimate of each die´s defect-free measurement. The nearest-neighbor residual (NNR) method provides a straightforward, data-driven estimate of test measurements for improved identification of die outliers
  • Keywords
    automatic test equipment; integrated circuit testing; wafer-scale integration; NNR; die outliers; identification; nearest-neighbor residual method; statistical post-processing; test measurements; wafer sort; Application software; Large scale integration; Logic design; Logic testing; Manufacturing; Probability distribution; Production; Statistical analysis; Statistical distributions;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2002.1033795
  • Filename
    1033795
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=822832