• DocumentCode
    822842
  • Title

    Multilevel testability analysis and solutions for integrated Bluetooth transceivers

  • Author

    Ozev, Sule ; Orailoglu, Alex ; Olgaard, Christian V.

  • Author_Institution
    Comput. Eng. Dept., Univ. of California, San Diego, CA, USA
  • Volume
    19
  • Issue
    5
  • fYear
    2002
  • Firstpage
    82
  • Lastpage
    91
  • Abstract
    As use of wireless communications rises and profit margins shrink, low-cost solutions are becoming increasingly important. Incorporating test design and DFT into the system design flow is essential to achieving such solutions. This case study analyzes test requirements, implications, and test cost for low-cost Bluetooth systems, which enable communication among several electronic components
  • Keywords
    design for testability; radio access networks; telecommunication equipment testing; Bluetooth systems; DFT; RF specifications; RF transceiver; design optimizations; system design flow; test design; wireless communications; Bit error rate; Bluetooth; Circuit testing; Costs; Design for testability; Electronic equipment testing; Frequency conversion; Noise measurement; System testing; Transceivers;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2002.1033796
  • Filename
    1033796
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=822842