Title :
Oriented barium hexaferrite thin films prepared by pulsed laser deposition
Author :
Dorsey, P. ; Seed, R. ; Vittoria, C. ; Chrisey, D.B. ; Carosella, C. ; Lubitz, P. ; Horwitz, J.S.
Author_Institution :
Northeastern Univ., Boston, MA, USA
fDate :
9/1/1992 12:00:00 AM
Abstract :
Oriented thin films of barium hexaferrite, BaFe12O19, were grown in situ on (0001) sapphire substrates utilizing a pulsed laser deposition technique. X-ray diffraction, elastic backscattering spectrometry, ferrimagnetic resonance, and vibrating sample magnetometry confirm that the structure, composition, and magnetic parameters are consistent with films prepared by other techniques such as liquid phase epitaxy
Keywords :
Rutherford backscattering; X-ray diffraction examination of materials; barium compounds; ferrimagnetic properties of substances; ferrimagnetic resonance; ferrites; magnetic epitaxial layers; magnetic field measurement; magnetic thin films; pulsed laser deposition; (0001) sapphire substrates; Al2O3 substrates; BaFe12O19; X-ray diffraction; elastic backscattering spectrometry; ferrimagnetic resonance; liquid phase epitaxy; oriented thin films; pulsed laser deposition; vibrating sample magnetometry; Barium; Ferrimagnetic films; Magnetic resonance; Magnetoelasticity; Optical pulses; Pulsed laser deposition; Sputtering; Substrates; Transistors; X-ray lasers;
Journal_Title :
Magnetics, IEEE Transactions on
