S-parameter analysis of multiconductor, integrated circuit interconnect systems

The authors explore the use of S-parameter-based network techniques for the analysis of coupled, multiconductor, high-speed analog and digital integrated circuit interconnects. S-parameter-based computer-aided design (CAD) techniques, widely used in microwave network analysis, provide a powerful framework for the analysis of analog and digital integrated circuit interconnect systems. The specific additions to the existing S-parameter network analysis framework developed provide for multiport interconnect capabilities and for the use of multiconductor S-parameters derived from three categories of input parameters: (1) lossy quasi-static R,L,C and G; (2) lossy frequency-dependent (dispersive) R,L ,C,G; and (3) the propagation constants, characteristic impedance, and conductor eigencurrents, derived from full-wave electromagnetic analysis. Results are compared with computed simulations and experimental measurements