Magnetization cross-track correlations and transition noise of longitudinal thin film media

Author

Hsu, Yimin ; Zhu, Jian-Gang ; Sivertsen, John M. ; Judy, Jack H.

Author_Institution

Center for Micromagn. & Inf. Technol., Minnesota Univ., Minneapolis, MN, USA

Volume

28

Issue

5

fYear

1992

fDate

9/1/1992 12:00:00 AM

Firstpage

3273

Lastpage

3275

Abstract

A method for measuring cross-track correlation length s of thin-film media in different DC demagnetized states has been developed. The method utilizes spectrum analysis of reverse DC erase noise and an improved technique for in-situ remanence curve measurements with negligible demagnetizing field effects. It was found that the value of s, with a typical order between 0.01 μm and 0.1 μm, is a slow-varying function of the remanent magnetization near the coercive remanent state. It was also found that recording media noise is approximately proportional to s

Keywords

magnetic recording; magnetic thin films; 0.01 to 0.1 micron; DC demagnetized states; coercive remanent state; cross-track correlation length; in-situ remanence curve measurements; longitudinal thin film media; magnetisation cross-track correlations; remanent magnetization; reverse DC erase noise; slow-varying function; spectrum analysis; transition noise; Demagnetization; Length measurement; Magnetic analysis; Magnetic field measurement; Magnetic force microscopy; Magnetic heads; Magnetization; Noise measurement; Remanence; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.179781

Filename

179781