Title :
Magnetization reversal mechanism evaluated by rotational hysteresis loss analysis for the thin film media
Author :
Takahashi, Migaku ; Shimatsu, T. ; Suekane, M. ; Miyamura, M. ; Yamaguchi, K. ; Yamasaki, H.
Author_Institution :
Electron. Eng., Tohoku Univ., Sendai, Japan
fDate :
9/1/1992 12:00:00 AM
Abstract :
Rotational hysteresis loss analysis has been carried out for CoCrTa, CoNiPt, and CoCrPt thin-film media to evaluate the influence of microstructure on coercive force through the measurement of magnetic anisotropy. In each medium, the magnitudes of Hkgrain defined as a magnetic field where rotational hysteresis loss Wr diminishes remain almost a constant value independently of the values of coercive force. With increasing coercive force, the magnitude of the coercive force gradually becomes smaller than that of the switching field of magnetization Hp evaluated by torque analysis. Through the analysis of Hkgrain and H p, it is suggested that the coercive force in each examined medium is strongly dependent on the degree of intergranular exchange coupling and/or magnetostatic interactions. While on CoNiPt and CoCrPt media coercive force depends on the rotational hysteresis integral, no correlation between them was observed in CoCrTa films
Keywords :
chromium alloys; cobalt alloys; coercive force; exchange interactions (electron); magnetic anisotropy; magnetic hysteresis; magnetic thin films; magnetisation reversal; magnetostatic waves; nickel alloys; platinum alloys; tantalum alloys; CoCrPt; CoCrTa; CoNiPt; coercive force; intergranular exchange coupling; magnetic anisotropy; magnetization; magnetostatic interactions; microstructure; rotational hysteresis loss analysis; switching field; thin film media; torque analysis; Coercive force; Force measurement; Loss measurement; Magnetic analysis; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetic hysteresis; Magnetization reversal; Microstructure;
Journal_Title :
Magnetics, IEEE Transactions on