Title :
Efficient algorithm for untestable path detection
Author :
Heo, Hun ; Hwang, Sun Young
Author_Institution :
Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea
fDate :
4/11/1996 12:00:00 AM
Abstract :
The authors present an algorithm for detecting untestable paths in multi-level circuits. By constructing equivalent normal form (ENF) for reconvergent paths only, the proposed algorithm detects and removes untestable paths efficiently in terms of run-time and memory usage
Keywords :
logic gates; logic testing; multivalued logic circuits; equivalent normal form; memory usage; multi-level circuits; reconvergent paths; run-time; untestable path detection;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19960499
