• DocumentCode
    823517
  • Title

    Efficient algorithm for untestable path detection

  • Author

    Heo, Hun ; Hwang, Sun Young

  • Author_Institution
    Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea
  • Volume
    32
  • Issue
    8
  • fYear
    1996
  • fDate
    4/11/1996 12:00:00 AM
  • Firstpage
    707
  • Lastpage
    708
  • Abstract
    The authors present an algorithm for detecting untestable paths in multi-level circuits. By constructing equivalent normal form (ENF) for reconvergent paths only, the proposed algorithm detects and removes untestable paths efficiently in terms of run-time and memory usage
  • Keywords
    logic gates; logic testing; multivalued logic circuits; equivalent normal form; memory usage; multi-level circuits; reconvergent paths; run-time; untestable path detection;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19960499
  • Filename
    491040
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=823517