• DocumentCode
    824476
  • Title

    High-Tc-superconductor-sapphire microwave resonator with extremely high Q-values up to 90 K

  • Author

    Shen, Zhi-Yuan ; Wilker, Charles ; Pang, Philip ; Holstein, William L. ; Face, Dean ; Kountz, Dennis J.

  • Author_Institution
    E.l. DuPont de Nemours & Co. Inc., Wilmington, DE, USA
  • Volume
    40
  • Issue
    12
  • fYear
    1992
  • fDate
    12/1/1992 12:00:00 AM
  • Firstpage
    2424
  • Lastpage
    2431
  • Abstract
    A theoretical analysis was performed for an extremely high-Q resonator formed by a sapphire rod sandwiched by a pair of high- Tc superconductor (HTS) films. A number of these HTS-sapphire-HTS resonators at C-band and Ka-band were designed, fabricated, and tested. At 5.552 GHz, Q0 reached 2×106 at 90 K, 3×106 at 80 K and 1.4×107 at 4.2 K with circulating power up to 500 kW. Formulas for calculating the resonant frequency and Q-value derived from the theoretical analysis were verified by experimental data with good agreement. Three different thin-film HTS materials-Tl2 Ba2CaCu2O8, YBa2Cu3O7-δ and Tl0.5Pb0.5Sr2CaCu2O7 -were tested. The sensitivity of the high Q-value and the parasitic coupling to the case modes are discussed. Applications such as frequency stabilized oscillators, filters, and HTS film characterization are described
  • Keywords
    Q-factor; high-temperature superconductors; resonators; sapphire; solid-state microwave devices; superconducting microwave devices; superconducting thin films; 4.2 to 90 K; 5.552 GHz; 500 kW; C-band; Ka-band; Tl0.5Pb0.5Sr2CaCu2O 7-Al2O3; Tl2Ba2CaCu2O8-Al 2O3; YBa2Cu3O7-Al2O3 ; film characterization; filters; frequency stabilized oscillators; high-Q resonator; high-Tc superconductor films; microwave resonator; sapphire rod; thin-film; Copper; Frequency; High temperature superconductors; Microwave filters; Microwave oscillators; Superconducting films; Superconducting filters; Superconducting microwave devices; Surface resistance; Testing;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.179912
  • Filename
    179912