DocumentCode :
824588
Title :
Generic linear RC delay modeling for digital CMOS circuits
Author :
Deng, An-Chang ; Shiau, Yan-Chyuan
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Volume :
9
Issue :
4
fYear :
1990
fDate :
4/1/1990 12:00:00 AM
Firstpage :
367
Lastpage :
376
Abstract :
The linear RC delay modeling technique is used to model the timing delays in CMOS circuit empirically. The empirical model, a multidimensional function of various circuit and device parameters, is shown to be simplified to a two-dimensional model which estimates the delay of a CMOS subcircuit in terms of the generic RC delay ad the rise/fall time of the input transition. Accuracy limitations of the linear RC delay model are investigated; namely, (i) the single-time-constant approximation on the multiple-pole network function; (ii) the linear resistance approximation on the nonlinear MOSFET characteristic; and (iii) the step-input waveform assumption. These accuracy problems are handled by: (1) presenting an accuracy measure of the simpler model and an option for using the more accurate two-time-constant model; (2) exploiting the nonlinear body effect in the transmission gate to improve the linear resistance characterization; and (3) using the piecewise-linear characterization on the input rise/fall time effect. The model has been installed in an experimental simulator and tested for various circuits. Comparisons are made with SPICE to validate the model reliability
Keywords :
CMOS integrated circuits; circuit analysis computing; delays; digital integrated circuits; semiconductor device models; accuracy measure; accuracy problems; digital CMOS circuits; empirical model; experimental simulator; input rise/fall time effect; input transition; linear RC delay modeling; linear resistance approximation; multidimensional function; multiple-pole network function; nonlinear MOSFET characteristic; nonlinear body effect; piecewise-linear characterization; single-time-constant approximation; step-input waveform assumption; timing delays; two-dimensional model; two-time-constant model; Circuit testing; Delay effects; Delay estimation; Immune system; Linear approximation; Multidimensional systems; Propagation delay; Semiconductor device modeling; Timing; Transfer functions;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.45868
Filename :
45868
Link To Document :
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