Title :
An analysis of the aliasing probability of multiple-input signature registers in the case of a 2m-ary symmetric channel
Author :
Iwasaki, Kazuhiko ; Arakawa, Fumo
Author_Institution :
Hitachi Ltd., Kokubunji, Tokyo, Japan
fDate :
4/1/1990 12:00:00 AM
Abstract :
The aliasing probabilities of multiple-input signature registers (MISR) with m inputs for a 2m-ary symmetric channel, where each of the (2m-1) possible errors is equally likely, are analyzed. For this error model, the aliasing probabilities of MISRs are analyzed using the weight distributions of maximum-distance-separable (MDS) codes. The results show that the aliasing probabilities over the 2m-ary symmetric channel do not depend on the polynomials that characterize the MISRs. That is, for the 2m-ary symmetric channel, the aliasing probability of an MISR based on a primitive polynomial is exactly the same as one based on a nonprimitive one. In addition, it is observed that the aliasing probabilities, Pal (n), as a function of test length n, are monotonous for error probabilities p=0.2, 0.4, and 0.8. The aliasing probabilities of multiple MISRs based on Reed-Solomon codes are analyzed again for the 2m -ary symmetric channel, using the weight distributions of Reed-Solomon codes, which are MDS codes
Keywords :
automatic testing; coding errors; error analysis; integrated circuit testing; logic testing; polynomials; probability; shift registers; 2m-ary symmetric channel; BIST; LSI testing; MDS codes; Reed-Solomon codes; aliasing probability; built-in self testing; error model; logic testing; maximum-distance-separable; multiple-input signature registers; polynomials; signature analysis testing; weight distributions; Circuit faults; Circuit testing; Computer aided software engineering; Ear; Error probability; Feedback; Large scale integration; Polynomials; Reed-Solomon codes; Shift registers;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
