DocumentCode :
824932
Title :
Effects of Ionizing Radiation on a 244 Line by 188 Element Charge Injection Device Imager
Author :
Killiany, J.M. ; Baker, W.D.
Author_Institution :
Naval Research Laboratory, Washington, D. C. 20375
Volume :
23
Issue :
6
fYear :
1976
Firstpage :
1644
Lastpage :
1647
Abstract :
The total dose effects of gamma radiation on an unhardened 244 line by 188 element charge injection device (CID) imager have been investigated. Key device parameters were monitored and the primary failure mechanisms identified. The operating parameters which are compatible with the largest possible total dose tolerance were determined.
Keywords :
Charge coupled devices; Clocks; Electrodes; Failure analysis; Interface states; Ionizing radiation; Potential well; Substrates; Switches; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1976.4328556
Filename :
4328556
Link To Document :
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