Title :
Hand Analysis Techniques for Neutron Degradation of Operational Amplifiers
Author :
Johnston, Allan H.
Author_Institution :
Boeing Aerospace Company Seattle, Washington
Keywords :
Bipolar transistors; Circuit analysis; Costs; Current density; Degradation; Electric variables; Gain measurement; Linearity; Neutrons; Operational amplifiers;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1976.4328566
