Title :
Cellular automata based pattern generator for testing RAM
Author :
Chowdhury, D. Roy ; Gupta, I. Sen ; Chaudhuri, P. Pal
Author_Institution :
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
fDate :
11/1/1992 12:00:00 AM
Abstract :
Presents a new strategy for parallel testing of RAM. A cellular automata (CA) based test pattern generator for detecting pattern sensitive faults (PSFs) in random access memories is also reported. An eight-cell one dimensional three neighbourhood CA has been extended to the five-neighbourhood case preserving the criterion of local connections. By changing the neighbourhood relation, all the 64 patterns for detecting the five-neighbourhood PSFs can be generated by loading two seeds only. The method can be easily extended for detecting PSFs of any neighbourhood.
Keywords :
cellular automata; logic testing; random-access storage; RAM; cellular automata; parallel testing; pattern sensitive faults; test pattern generator;
Journal_Title :
Computers and Digital Techniques, IEE Proceedings E
