DocumentCode :
825307
Title :
Multi-scale statistical process monitoring in machining
Author :
Li, Xiaoli ; Yao, Xin
Author_Institution :
Centre of Excellence for Res. in Comput. Intelligence & Applications, Univ. of Birmingham, UK
Volume :
52
Issue :
3
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
924
Lastpage :
927
Abstract :
Most practical industrial process data contain contributions at multiple scales in time and frequency. Unfortunately, conventional statistical process control approaches often detect events at only one scale. This paper addresses a new method, called multiscale statistical process monitoring, for tool condition monitoring in a machining process, which integrates discrete wavelet transform (WT) and statistical process control. Firstly, discrete WT is applied to decompose the collected data from the manufacturing system into uncorrelated components. Next, the detection limits are formed for each decomposed component by using Shewhart control charts. A case study, i.e., tool condition monitoring in turning using an acoustic emission signal, demonstrates that the new method is able to detect abnormal events (serious tool wear or breakage) in the machining process.
Keywords :
acoustic emission; condition monitoring; control charts; discrete wavelet transforms; statistical process control; turning (machining); Shewhart control charts; acoustic emission; discrete wavelet transform; industrial process data; machining process; multiscale statistical process monitoring; statistical process control; tool condition monitoring; Acoustic signal detection; Condition monitoring; Control charts; Discrete wavelet transforms; Event detection; Frequency; Machining; Manufacturing systems; Process control; Turning; Condition monitoring; machining processes; statistical process control (SPC); wavelet transform (WT);
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2005.847580
Filename :
1435704
Link To Document :
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