DocumentCode :
82531
Title :
Photopatterning of Thiol-ene-Acrylate Copolymers
Author :
Kasprzak, S.E. ; Wester, Brock A. ; Raj, T. ; Allen, M. ; Gall, K.
Author_Institution :
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
22
Issue :
2
fYear :
2013
fDate :
Apr-13
Firstpage :
339
Lastpage :
348
Abstract :
Thiol-ene-acrylate copolymers exhibit a unique blend of characteristics which make them suitable for both photolithographic patterning and material property tuning. Five thiol-ene-acrylate monomer blends are found to exhibit similar reaction rates via photo-differential scanning calorimetry, while dynamic mechanical analysis shows the trend in the thermomechanical properties of three of the systems. Two selected thiol-ene-acrylate systems showed rapid polymerization with low apparent shrinkage and relatively low heat evolution (when compared to acrylates) with excellent patternability, while a binary acrylate system shows extreme apparent shrinkage, greater heat evolution, and does not replicate the mask pattern in a controllable fashion. The apparent shrinkage is a measure of patternability, since this quantity represents the actual polymer dimensions when compared to the desired dimension (i.e., photomask pattern).
Keywords :
chemical reactions; differential scanning calorimetry; photolithography; polymer blends; polymerisation; binary acrylate system; dynamic mechanical analysis; mask pattern; material property tuning; photodifferential scanning calorimetry; photolithographic patterning; photopatterning; polymer dimensions; polymerization; reaction rates; thermomechanical properties; thiol-ene-acrylate copolymers; thiol-ene-acrylate monomer blends; thiol-ene-acrylate systems; Heating; Lithography; Microscopy; Optical imaging; Polymers; Thermomechanical processes; Materials processing; materials science and technology; materials testing; photolithography;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2012.2226927
Filename :
6373683
Link To Document :
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