DocumentCode :
82533
Title :
A 1.1 V 2y-nm 4.35 Gb/s/pin 8 Gb LPDDR4 Mobile Device With Bandwidth Improvement Techniques
Author :
Keunsoo Song ; Sangkwon Lee ; Dongkyun Kim ; Youngbo Shim ; Sangil Park ; Bokrim Ko ; Duckhwa Hong ; Yongsuk Joo ; Wooyoung Lee ; Yongdeok Cho ; Wooyeol Shin ; Jaewoong Yun ; Hyengouk Lee ; Jeonghun Lee ; Eunryeong Lee ; Namkyu Jang ; Jaemo Yang ; Hae-kan
Author_Institution :
SK hynix, Icheon, South Korea
Volume :
50
Issue :
8
fYear :
2015
fDate :
Aug. 2015
Firstpage :
1945
Lastpage :
1959
Abstract :
The demands on higher bandwidth with reduced power consumption in mobile market are driving mobile DRAM with advanced design techniques. Proposed LPDDR4 in this paper achieves over 39% improvement in power efficiency and over 4.3 Gbps data rate with 1.1 V supply voltage. These are challenging targets compared with those of LPDDR3. This work describes design schemes employed in LPDDR4 to satisfy these requirements, such as multi-channel-per-die architecture, multiple training modes, low-swing interface, DQS and clock frequency dividing, and internal reference for data and command-address signals. This chip was fabricated in a 3-metal 2y-nm DRAM CMOS process.
Keywords :
CMOS memory circuits; DRAM chips; mobile handsets; CMOS process; DQS; LPDDR4 mobile device; bandwidth improvement techniques; clock frequency dividing; command address signal reference; data signal reference; internal reference; low swing interface; mobile DRAM; multichannel-per-die architecture; multiple training modes; voltage 1.1 V; Bandwidth; Clocks; Mobile communication; Oscillators; Random access memory; Timing; Training; Command bus training; DQS oscillator; DRAM; LPDDR4; ZQ calibration; dram interface; memory SERDES; memory architecture; read DQ calibration; tDQS2DQ; training; write leveling; write training;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2015.2429588
Filename :
7115193
Link To Document :
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