DocumentCode :
825453
Title :
A Description of the Basic Mechanisms of Electrical Excitation Techniques for Simulating System-Generated EMP
Author :
Higgins, Daniel F.
Author_Institution :
Mission Research Corporation Santa Barbara, California 93102
Volume :
23
Issue :
6
fYear :
1976
Firstpage :
1958
Lastpage :
1963
Abstract :
This paper extends previous studies of electrical excitation techniques for SGEMP simulation by considering simulation in terms of basic electromagnetic response parameters. Thus, fundamental properties of Maxwell´s equations and basic symmetry relationships are emphasized rather than detailed computer calculations or specific experimental data.
Keywords :
Boundary conditions; Computational modeling; Conductors; Current density; EMP radiation effects; Electromagnetic coupling; Electromagnetic radiation; Electron emission; Maxwell equations; Skin;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1976.4328606
Filename :
4328606
Link To Document :
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