Title :
Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks
Author :
Li, Wenjian ; Pham, Hoang
Author_Institution :
Dept. of Ind. Eng., Rutgers Univ., Piscataway, NJ, USA
fDate :
6/1/2005 12:00:00 AM
Abstract :
In this paper, we develop a generalized multi-state degraded system reliability model subject to multiple competing failure processes, including two degradation processes, and random shocks. The operating condition of the multi-state systems is characterized by a finite number of states. We also present a methodology to generate the system states when there are multi-failure processes. The model can be used not only to determine the reliability of the degraded systems in the context of multi-state functions, but also to obtain the states of the systems by calculating the system state probabilities. Several numerical examples are given to illustrate the concepts.
Keywords :
failure analysis; probability; reliability theory; degradation process; degraded system reliability; multicompeting failures; multistate degraded system; multistate function; random shock; reliability modeling; system state probabilities; Availability; Context modeling; Convolution; Degradation; Electric shock; Maintenance; Predictive models; Probability; Reliability; State-space methods; Degradation processes; degraded system reliability; multi-state reliability; multiple-failure processes; random shocks;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.2005.847278