DocumentCode :
825506
Title :
Effect of Thin Film Thicknesses and Materials on the Response of RTDs and Microthermocouples
Author :
Imran, Muhammad ; Bhattacharyya, Abhijit
Author_Institution :
Dept. of Appl. Sci., Arkansas Univ., Little Rock, AR
Volume :
6
Issue :
6
fYear :
2006
Firstpage :
1459
Lastpage :
1467
Abstract :
Fabrication and thermal characterization of a resistance temperature detector (RTD) heater and microthermocouples (MTs) on silicon substrates have been reported in this paper. The influence of film thickness and nickel-gold (Au) electroplating on RTD on its steady-state temperature with respect to its steady-state electrical power input and resistance is studied. Further, the thermal effects of multiple thermocouples in a thermopile as well as the effects of Au layers in the contact pads of the thermopiles on their open-circuit Seebeck voltage are studied. Therein lies the novelty of this paper. The in situ operating relationships for the RTD heater and the MT are provided
Keywords :
Seebeck effect; electroplating; resistance thermometers; semiconductor thin films; silicon; thermocouples; thermopiles; NiAu-Si; RTD heater; electroplating; microthermocouples; open-circuit Seebeck voltage; resistance temperature detector; steady-state temperature; thermal characterization; thermal effects; thermopile; thin film materials; thin film thicknesses; Detectors; Electric resistance; Fabrication; Gold; Resistance heating; Silicon; Steady-state; Temperature; Thermal resistance; Transistors; Microthermocouple (MT); relative Seebeck coefficient (RSC); resistance temperature detector (RTD);
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2006.884167
Filename :
4014167
Link To Document :
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