Title :
Identify unrepairability to speed-up spare allocation for repairing memories
Author :
Liang, Hsing-Chung ; Ho, Wen-Chin ; Cheng, Ming-Chieh
Author_Institution :
Dept. of Electron. Eng., Chang Gung Univ., Tao-Yuan, Taiwan
fDate :
6/1/2005 12:00:00 AM
Abstract :
In this paper, we discuss some strategies for identifying unrepairable memories, and from that to introduce a novel theorem that can make more precise identification. A new algorithm for searching repair solutions is also proposed, which characterizes the rows, and columns of defective memory cells with revised effective coefficients. We have simulated it on many generated example maps, and compared it with the previous algorithms to verify its efficiency. It´s combined with those arranged strategies of judging unrepairability to generate a complete flow. The complete algorithm has also been run on many examples with various memory sizes, defect numbers, and distribution types. The simulation results further show that identifying unrepairability in advance can help the reconfiguration procedure run much faster than searching solutions directly.
Keywords :
digital storage; fault diagnosis; identification; maintenance engineering; redundancy; reliability theory; defect number; defective memory cell; distribution type; judging unrepairability; memory redundancy; memory sizes; precise identification; repair solution searching; repairing memories; speed-up spare allocation; unrepairability identification; unrepairable memories; Bipartite graph; Clustering algorithms; Cost function; Councils; Fault detection; Fault diagnosis; Lead; Production; Redundancy; Testing; Memory redundancy; reconfiguration; repair solution; repairability; spare allocation;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.2005.847248