Title :
Irradiated Electronics Reliability Study
Author :
Ashley, Chris ; Deve, Bernd
Author_Institution :
Air Force Weapons Laboratory Kirtland Air Force Base Albuquerque, New Mexico
Keywords :
Aerospace electronics; Circuit testing; Control systems; Degradation; Electronic equipment testing; Force control; Hardware; Laboratories; System testing; Weapons;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1976.4328619
