DocumentCode :
825744
Title :
On the limiting density of field emission current from metals
Author :
Mesyats, G.A. ; Uimanov, I.V.
Author_Institution :
Inst. of Electrophys., Russian Acad. of Sci., Ekaterinburg, Russia
Volume :
13
Issue :
1
fYear :
2006
Firstpage :
105
Lastpage :
110
Abstract :
The present work considers the problem of the field emission characteristics of metals for the range of external electric fields 108-109 V/cm. It has been shown that, as far as the field emission is considered, ultrahigh fields are the electric fields at which the decrease of the height of the potential barrier due to the Schottky effect is greater than the work function of the emitter. In this case, the penetration of the external electric field into the metal emitter results in a substantial increase in electron density near the emission boundary. It has also been shown that the Fowler-Nordheim relation that describes the electric field dependence of the current density does not hold at ultrahigh fields. Analytical expressions for this dependence have been obtained taking into account the perturbation of the electronic structure of the emitter by the external electric field both in the WKB and in the Miller-Good approximation in the low-temperature limit. Based on the results obtained, it has been shown that the saturation of the FE current density does not happen, as supposed earlier, and the current density practically linearly increases with electric field.
Keywords :
Schottky barriers; approximation theory; current density; electron density; electron field emission; FE current density; Fowler-Nordheim relation; Miller-Good approximation; Schottky effect; WKB approximation; analytical expression; electric field; electron density; electronic structure perturbation; explosive electron emission; field electron emission characteristic; metal emitter; potential barrier; ultrahigh field; Cathodes; Current density; Delay; Distribution functions; Electron accelerators; Electron beams; Electron emission; Explosives; Iron; Tungsten;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2006.1593408
Filename :
1593408
Link To Document :
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